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Analysis of Vertical Behavior and Si/VOx Interface Characteristics of Vanadium Oxide Film using E-beam
학술지명 : IUMRS-ICA
게재년월 : 2021.10.04 |
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"Analysis of Vertical Behavior and Si/VOx Interface Characteristics of Vanadium Oxide Film using E-beam"
Hyobin Choi, Wanggon Lee, Jaeseong Lim, Heecheol Shin, and Hyungtak Seo*
2021 IUMRS, ICC Jeju, Jeju Island, Korea, 10월 04일 [Poster] |
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